DoP234: Domain wall trapping as a result of internal bias fields
- 1 August 1992
- journal article
- research article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 133 (1) , 223-228
- https://doi.org/10.1080/00150199208218003
Abstract
A model is proposed, which explains quantitatively the aging of material properties as domain wall clamping by orienting defects. The model is examined by aging measurements.Keywords
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