Study of germanium in the field ion microscope
- 31 August 1972
- journal article
- Published by Elsevier in Surface Science
- Vol. 32 (2) , 387-396
- https://doi.org/10.1016/0039-6028(72)90168-9
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- A refined model of the metal surface and its interaction with gases in the field ion microscopeSurface Science, 1968
- A method for indexing field ion micrographsJournal of Scientific Instruments, 1967
- Field‐Emission Microscopy of GermaniumPhysica Status Solidi (b), 1967
- Surface structure and surface migration of germanium by field emission microscopyJournal of Physics and Chemistry of Solids, 1964
- Über die Oberflächenreinigung von Germaniumspitzen durch Felddesorption im FeldemissionsmikroskopPhysica Status Solidi (b), 1964
- Structural Properties of Cleaved Silicon and Germanium SurfacesJournal of Applied Physics, 1963
- Field emission from silicon and germanium; field desorption and surface migrationJournal of Physics and Chemistry of Solids, 1961