Retrofitted confocal laser scanner for a commercial inverted fluorescence microscope
- 1 August 2001
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 72 (8) , 3407-3410
- https://doi.org/10.1063/1.1382637
Abstract
No abstract availableKeywords
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- Precision, Post-Objective, Two-Axis, Galvanometer ScanningPublished by SPIE-Intl Soc Optical Eng ,1983