Picosecond optical sampling of GaAs integrated circuits
- 1 February 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 24 (2) , 198-220
- https://doi.org/10.1109/3.115
Abstract
Direct electrooptic sampling is a noncontact optical-probing technique for measuring with picosecond time resolution the voltage waveforms at internal nodes within GaAs integrated circuits. The factors contributing to system bandwidth, sensitivity, spatial resolution, and circuit perturbation are discussed, as are the circuit requirements for realistic testing of analog and digital devices. Measurements of high-speed GaAs integrated circuits are presented, including time-domain waveform and timing measurements of digital and analog circuits and frequency-domain transfer function measurements of microwave circuits and transmission structures.Keywords
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