Models for time coalescence in event logs
- 2 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 221-227
- https://doi.org/10.1109/ftcs.1992.243597
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Error log analysis: statistical modeling and heuristic trend analysisIEEE Transactions on Reliability, 1990
- Derivation and Calibration of a Transient Error Reliability ModelIEEE Transactions on Computers, 1982