Accurate quasi-TEM spectral domain analysis of single and multiple coupled microstrip lines of arbitrary metallization thickness
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 43 (8) , 1881-1888
- https://doi.org/10.1109/22.402277
Abstract
No abstract availableKeywords
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