Review Grain and subgrain characterisation by electron backscatter diffraction

• 1 January 2001
• journal article
• Published by Springer Nature in Journal of Materials Science
• Vol. 36  (16) , 3833-3854
• https://doi.org/10.1023/a:1017973432592

Abstract

Keywords

• RECRYSTALLIZATION
• FIELD EMISSION
• IMAGING METHOD
• CONVENTIONAL IMAGING
• ANGULAR RESOLUTION