Measuring Dielectric Constant of Substrates for Microstrip Applications (Letters)
- 1 July 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 24 (7) , 485-487
- https://doi.org/10.1109/tmtt.1976.1128881
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A New Method for Measuring Properties of Dielectric Materials Using a Microstrip Cavity (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1974
- Coupling Errors in Cavity-Resonance Measurements on MIC Dielectrics (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1973
- A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1973
- A Simple Technique for the Accurate Determination of the Microwave Dielectric Constant for Microwave Integrated Circuit Substrates (Correspondence)IEEE Transactions on Microwave Theory and Techniques, 1971
- Microstrip Lines for Microwave Integrated CircuitsBell System Technical Journal, 1969