Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)
- 3 October 1988
- journal article
- Published by Elsevier in Surface Science
- Vol. 205 (1-2) , 25-37
- https://doi.org/10.1016/0039-6028(88)90162-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Reflection electron energy loss spectroscopy (reels): A technique for the study of surfacesSurface Science, 1988
- Electron resonance channeling on crystal surfaces in reflection high energy electron diffraction geometryUltramicroscopy, 1987
- Characterization and Reactivity of Molecular Oxygen Species on Oxide SurfacesPublished by Elsevier ,1983
- Foil thickness measurements from convergent-beam diffraction patterns An experimental assessment of errorsPhilosophical Magazine A, 1982
- Formulae for light-element micro analysis by electron energy-loss spectrometryUltramicroscopy, 1978
- Energieverlustmessungen von schnellen Elektronen an Oberflächen von Ga, In, Al und SiZeitschrift für Physik B Condensed Matter, 1976
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Resonance effects in low and high energy electron diffraction by crystalsActa Crystallographica Section A, 1970