Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy
- 1 May 1994
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 243 (1-2) , 610-615
- https://doi.org/10.1016/0040-6090(93)04168-r
Abstract
No abstract availableKeywords
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