Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing
- 29 April 1996
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 68 (18) , 2526-2528
- https://doi.org/10.1063/1.116172
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: