SEU and latchup tolerant advanced CMOS technology
- 1 December 1990
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (6) , 1869-1875
- https://doi.org/10.1109/23.101203
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Latch-up on CMOS/EPI devicesIEEE Transactions on Nuclear Science, 1990
- Advantage of Advanced CMOS over Advanced TTL in a Cosmic Ray EnvironmentIEEE Transactions on Nuclear Science, 1987
- Techniques of Microprocessor Testing and SEU-Rate PredictionIEEE Transactions on Nuclear Science, 1985
- Latchup in CMOS Devices from Heavy IonsIEEE Transactions on Nuclear Science, 1983