Low "g" Sensitivity Crystal Units and Their Testing

• 1 January 1979
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 306-310
• https://doi.org/10.1109/freq.1979.200333

Abstract

Keywords

• TESTING
• THERMAL STRESSES
• FREQUENCY
• MANUFACTURING
• AGING
• TEMPERATURE SENSORS
• TEMPERATURE CONTROL
• ACCELERATION
• OVENS
• FABRICATION