Quantitative analysis of scanning electron micrographs

• 1 February 1972
• journal article
• Published by Wiley in Journal of Microscopy
• Vol. 95  (1) , 45-58
• https://doi.org/10.1111/j.1365-2818.1972.tb03710.x

Abstract

Keywords

• IRREGULAR SURFACES
• SCANNING ELECTRON MICROGRAPHS
• QUANTITATIVE
• SPECIMEN
• MICROGRAPHS SCANNING
• TWO PARTS
• SPECIFIC FEATURES