Structural defects in annealed silicon containing oxygen
- 1 July 1978
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 49 (7) , 3870-3874
- https://doi.org/10.1063/1.325392
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Characterization of structural defects in annealed silicon containing oxygenJournal of Applied Physics, 1976
- Formation and nature of swirl defects in siliconApplied Physics A, 1975
- X-ray anomalous transmission and topography of oxygen precipitation in siliconJournal of Applied Physics, 1973
- Neutron irradiation damage in molybdenumPhilosophical Magazine, 1971
- The solubility of carbon in pulled silicon crystalsJournal of Physics and Chemistry of Solids, 1971
- Oxygen Content of Silicon Single CrystalsJournal of Applied Physics, 1957