Exafs studies of bismuth doped nanocrystalline copper
- 30 June 1993
- journal article
- Published by Elsevier in Acta Metallurgica et Materialia
- Vol. 41 (6) , 1769-1772
- https://doi.org/10.1016/0956-7151(93)90196-y
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Structural characterization of nanometer-sized crystalline Pd by x-ray-diffraction techniquesPhysical Review B, 1991
- EXAFS studies on nanocrystalline tungstenPhilosophical Magazine Letters, 1991
- Diffusion and Low Temperature Deformation by Diffusional Creep of Nanocrystalline MaterialsDefect and Diffusion Forum, 1991
- HREM-studies of the microstructure of nanocrystalline palladiumScripta Metallurgica et Materialia, 1990
- Nanocrystalline materialsMaterials Science and Engineering: A, 1989
- Exafs studies of nanocrystalline materials exhibiting a new solid state structure with randomly arranged atomsPhysics Letters A, 1989
- Nanocrystalline materialsProgress in Materials Science, 1989
- Improved ab initio calculations of amplitude and phase functions for extended x-ray absorption fine structure spectroscopyJournal of the American Chemical Society, 1988
- Extended x-ray absorption fine structure analysis of interatomic distances, coordination numbers, and mean relative displacements in disordered alloysPhysical Review B, 1980
- Segregation to interfacesInternational Materials Reviews, 1977