Theoretical approach for quantitative analysis of electron spectroscopies: E.P.E.S. and E.E.L.S.
- 1 April 1989
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. 39 (4) , 508-512
- https://doi.org/10.1088/0031-8949/39/4/016
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A study by elastically reflected electrons of InP(100) substrates previously ion bombardedJournal of Physics D: Applied Physics, 1986
- Elastic peak electron spectroscopyScanning, 1986
- Surface composition of (100)InP substrates bombarded by low energy Ar+ ions, studied by AES and EPESSurface Science, 1985
- Elastic backscattering of electrons from surfacesSurface Science, 1985
- The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solidsSurface Science, 1984
- The elastic peak in AES and EELSVacuum, 1983
- Imaging of surfaces in LEED instrumentsJournal of Physics E: Scientific Instruments, 1982
- Elastic peak electron spectroscopy for auger electron spectroscopy and electron energy loss spectroscopySurface and Interface Analysis, 1981
- Theoretical electron scattering amplitudes and spin polarizations: Electron energies 100 to 1500 eV Part II. Be, N, O, Al, Cl, V, Co, Cu, As, Nb, Ag, Sn, Sb, I, and Ta targetsAtomic Data and Nuclear Data Tables, 1972
- A simple model for the dependence of Auger intensities on specimen thicknessSurface Science, 1969