Routine SIMS microanalysis: Trace Au and Pt in sulphides
- 1 December 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 35 (3-4) , 358-363
- https://doi.org/10.1016/0168-583x(88)90296-0
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Trace Element Analysis by Secondary Ion Mass Spectrometry with Particular Reference to Silver in the Brunswick SphaleriteCanadian Metallurgical Quarterly, 1986
- The platinum-group element and gold contents of the marginal rocks and sills of the Bushveld ComplexEconomic Geology, 1985
- Applications of the Ion Microprobe to Geochemistry and CosmochemistryAnnual Review of Earth and Planetary Sciences, 1982
- Quantitative secondary ion mass spectrometry: A reviewSurface and Interface Analysis, 1980