Potential of confocal microscopes to resolve in the 50–100 nm range

• 9 December 1996
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 69  (24) , 3644-3646
• https://doi.org/10.1063/1.117010

Abstract

Keywords

• INFORMATION GAIN
• FULL WIDTH AT HALF MAXIMUM
• THREE DIMENSIONAL
• LIGHT SCATTERING
• OPTICAL MICROSCOPY
• NEAR FIELD SCANNING OPTICAL MICROSCOPY
• POINT SPREAD FUNCTION
• SIGNAL TO NOISE RATIO
• NUMERICAL APERTURE