252Cf-particle desorption mass spectrometry in a depth profiling mode
- 1 July 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 34 (1) , 89-96
- https://doi.org/10.1016/0168-583x(88)90369-2
Abstract
No abstract availableThis publication has 41 references indexed in Scilit:
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