A precise cavity technique for measuring low resistivity semiconductors

• 1 January 1965
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 53  (11) , 1742-1743
• https://doi.org/10.1109/proc.1965.4359

Abstract

Keywords

• CONDUCTIVITY
• COPPER
• RESONANT FREQUENCY
• PLUGS
• MICROWAVE MEASUREMENTS
• MICROWAVE THEORY AND TECHNIQUES
• SEMICONDUCTIVITY
• ELECTRICAL RESISTANCE MEASUREMENT
• SEMICONDUCTOR MATERIALS
• ORIFICES