Effect of the phase shift due to dynamical scattering on the contrast of crystal structure images
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 10 (3) , 229-235
- https://doi.org/10.1016/0304-3991(82)90043-2
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Detection of point defects accommodating nonstoichiometry in inorganic compoundsUltramicroscopy, 1982
- Atomic resolution with a 600-kV electron microscopeNature, 1979
- Approximations for the calculation of high-resolution electron-microscope images of thin filmsActa Crystallographica Section A, 1977
- A High Resolution Lattice Image of Nb12O29by Means of a High Voltage Electron Microscope Newly ConstructedJapanese Journal of Applied Physics, 1976
- Molecular image resolution in electron microscopyJournal of Applied Physics, 1972
- Electron Microscope Image Contrast for Thin CrystalZeitschrift für Naturforschung A, 1972
- High-Resolution Electron Microscopy of Crystal Lattice of Titanium-Niobium OxideJournal of Applied Physics, 1971
- Multiple phase formation in the binary system Nb2O5–WO3. VI. Electron microscopic observation and evaluation of non-periodic shear structuresActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969
- Imaging of Single Atoms with the Electron Microscope by Phase ContrastJournal of Applied Physics, 1966
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949