Loss calculation of single and coupled strip lines by extended spectral domain approach
- 1 July 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Guided Wave Letters
- Vol. 3 (7) , 211-213
- https://doi.org/10.1109/75.222778
Abstract
The extended spectral domain approach is used to calculate the losses of strip lines of arbitrary thickness. This versatile method is applicable to single and coupled strip lines with isotropic and/or anisotropic substrates. Both the simpler quasistatic and the rigorous hybrid-mode formulation can be developed on the same basis. Numerical examples presented include loss calculations for strip lines with thick conductors as well as thin conductors, with thickness comparable to or less than the skin depth. Numerical results show the usefulness and the limitation of the quasistatic analyses.Keywords
This publication has 12 references indexed in Scilit:
- Loss calculation of single and coupled strip lines by extended spectral domain approachIEEE Microwave and Guided Wave Letters, 1993
- Propagation characteristics of coplanar-type transmission lines with lossy mediaIEEE Transactions on Microwave Theory and Techniques, 1991
- A parameteric study of the attenuation constant of lossy microstrip linesIEEE Transactions on Microwave Theory and Techniques, 1990
- Losses in GaAs microstripIEEE Transactions on Microwave Theory and Techniques, 1990
- Metallization thickness effect of striplines with anisotropic media: quasi-static and hybrid-mode analysisIEEE Transactions on Microwave Theory and Techniques, 1989
- Variational method for multiconductor coupled striplines with stratified anisotropic mediaIEEE Transactions on Microwave Theory and Techniques, 1989
- Variational method for planar transmission lines with anisotropic magnetic mediaIEEE Transactions on Microwave Theory and Techniques, 1989
- Determination of Conductor Losses in Planar Waveguide Structures (A Comment to Some Published Results for Microstrips and Microslots) (Letters)IEEE Transactions on Microwave Theory and Techniques, 1980
- Variation of microstrip losses with thickness of stripElectronics Letters, 1971
- Formulas for the Skin EffectProceedings of the IRE, 1942