X-ray topography and EPMA studies of synthetic quartz
- 1 January 1973
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 19 (2) , 125-132
- https://doi.org/10.1016/0022-0248(73)90022-5
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- The theory of X-ray crystal diffraction for finite polyhedral crystals. I. The Laue–Bragg casesActa Crystallographica Section A, 1972
- X-ray topographic study of dislocations in synthetic quartzPhysica Status Solidi (a), 1971
- X-ray topographic studies of NaCl crystals grown from aqueous solution with Mn ionsJournal of Crystal Growth, 1968
- Dislocations and Fault Surfaces in Synthetic QuartzJournal of Applied Physics, 1967
- Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal TopographyJapanese Journal of Applied Physics, 1966
- Defects in Natural QuartzJournal of Applied Physics, 1966
- Defects in Synthetic QuartzJournal of Applied Physics, 1966