Scanning force/tunneling microscopy of a graphite surface in air

1 March 1991

journal article
research article
Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Vol. 9 (2) , 1092-1095
https://doi.org/10.1116/1.585267

Abstract

We discuss atomic resolution imaging of a graphite surface in air by simultaneously measuring repulsive contact forces and surface conductance with the scanning force/tunneling microscope (AFM/STM) under two types of operating modes: the constant height mode and the constant current mode. We also discuss the coherence of the images during simultaneous imaging with the AFM/STM, and further clarify the measurement condition for simultaneous imaging.