An XPS study of Si as it occurs in adsorbents, catalysts, and thin films
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- 9 October 2002
- journal article
- Published by Elsevier
- Vol. 15 (1-4) , 1-35
- https://doi.org/10.1016/0378-5963(83)90003-x
Abstract
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This publication has 36 references indexed in Scilit:
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