Modeling failure-data by mixture of 2 Weibull distributions: a graphical approach
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 44 (3) , 477-488
- https://doi.org/10.1109/24.406588
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: