Structural anomalies disturbing measurement of the quantum size effect
- 15 July 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 36 (1) , 75-79
- https://doi.org/10.1016/0040-6090(76)90405-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Electrical resistivity of thin bismuth filmsThin Solid Films, 1976
- Optical constants of thin film bismuthThin Solid Films, 1973
- Application of nematic liquid crystals for the investigation of p–n junctions and insulating layersPhysica Status Solidi (a), 1972
- Galvanomagnetic Studies of Bismuth Films in the Quantum-Size-Effect RegionPhysical Review B, 1972
- Quantum size effect–-present state and perspectives of experimental investigationsPhysica Status Solidi (a), 1970