High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 265-270
- https://doi.org/10.1016/s0169-4332(98)00538-8
Abstract
No abstract availableKeywords
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