A new appearance potential spectrometer
- 1 June 1985
- journal article
- Published by Springer Nature in Czechoslovak Journal of Physics
- Vol. 35 (6) , 630-642
- https://doi.org/10.1007/bf01595533
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A modification of the AEAPS methodCzechoslovak Journal of Physics, 1984
- Difference in the CrIntensity Ratio Measured by Soft-X-Ray and Auger-Electron Appearance-Potential SpectroscopyPhysical Review B, 1972
- A Soft X-Ray Appearance Potential Spectrometer for the Analysis of Solid SurfacesReview of Scientific Instruments, 1970