Characterisation and Modelling of Temperature and Dispersion Effects in Power MESFETs
- 1 October 1994
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Modelling of deviations between static and dynamic drain characteristics in GaAs FETsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1993
- Extraction of Linear and Non-Linear MESFET ModelsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991
- Modeling of frequency and temperature effects in GaAs MESFETsIEEE Journal of Solid-State Circuits, 1990