Static and Dynamic Studies of Magnetization Distribution in Thin Films by Electron Microscopy

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Abstract
Several modes of operation of a transmission electron microscope are discussed which are useful for the observation of the magnetization distribution in thin films. Gross defocusing of the instrument provides great sensitivity to slow variations in static magnetization direction, while slight defocusing enables the measurement of rapid variations of magnetization at high resolution. The applications of electron microscopy to dynamic wall studies is discussed; this can be demonstrated by motion pictures. Some new ways of observing domains and walls at instrumental focus are described which utilize an opaque knife edge for intercepting a fraction of the deflected electron beam below the specimen.

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