Charged Droplet Scrubbing for Fine Particle Control

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Abstract
Some basic mechanisms of interaction of highly charged scrubbing droplets with fine particulate are studied. In the fine particulate size range (1.0-0.1 micron), the most effective mechanisms are electrically augmented impact scrubbing and charge exchange without impact. A charged droplet scrubber using electrohydrodynamically sprayed droplets and an applied field to achieve electrical impact scrubbing is described. It is shown that such scrubbers are capable of high densities of droplets in the 100 jum size range, and charged to near their upper stability limit. Collection efficiencies of 30 to 50% per stage are demonstrated in the submicron particulate size range.

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