A high resolution multihit time to digital converter integrated circuit

• 1 June 1997
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
• Vol. 44  (3) , 379-384
• https://doi.org/10.1109/23.603675

Abstract

Keywords

• INTEGRATED CIRCUIT
• CHIP
• NUCLEAR PHYSICS
• HIGH RESOLUTION
• LENGTH MEASUREMENT