Raman studies of the electro-optic properties of CuX (X=Cl, Br, I) multicrystallite samples

Abstract
A measurement of the Raman scattering efficiencies from an ensemble of random‐oriented cyrstallites provides a method for evaluating the electro‐optic coefficients in CuX (X=Cl, Br, I) binary zinc‐blend semiconductors. A systematic trend in the values of both the electronic and ionic contributions to the nonlinear response is found to be related to the ionicities in these crystals.