Further Experimental Results on the SOGICON Characteristics
- 1 October 1963
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 2 (10)
- https://doi.org/10.1143/jjap.2.660
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Observations of Instability in Semiconductors caused by Heavily Injected Minority CarriersJournal of the Physics Society Japan, 1962
- The “Sogicon” –A New Type of Semiconductor OscillatorJournal of the Physics Society Japan, 1962
- A Reversed Carrier Transport Effect in GermaniumProceedings of the Physical Society, 1960