Formal Theoretical Foundation of Electrical Aging of Dielectrics

• 1 November 1981
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Power Engineering Review
• Vol. PER-1  (11) , 15
• https://doi.org/10.1109/MPER.1981.5511887

Abstract

Keywords

• AGING
• DIELECTRIC BREAKDOWN
• RESIDUAL STRESSES
• MATHEMATICAL MODEL
• DIFFERENTIAL EQUATIONS
• ELECTRIC BREAKDOWN
• PROBABILITY DISTRIBUTION
• DEGRADATION