The origin of sample memory in the Chalk River accelerator mass spectrometry sputter ion source
- 1 March 1996
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 67 (3) , 1416-1418
- https://doi.org/10.1063/1.1146683
Abstract
The origin of memory effects in the Chalk River accelerator mass spectrometry sputter ion source has been studied by tracer and elastic‐recoil‐detection surface analysis techniques. For 36Cl measurements, the results indicate that the memory arises from contamination of the region immediately surrounding the sample and that it can be mitigated by operating this portion of the ion source above 350 °C. This has reduced memory effects by a factor of 10 or more and has resulted in a similar improvement in background.Keywords
This publication has 3 references indexed in Scilit:
- Forward elastic recoil measurements using heavy ionsJournal of Applied Physics, 1994
- AMS measurements of 36Cl at Chalk RiverNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
- Accelerator mass spectrometry: State of the art in 1990Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990