X-Ray Measurement of Order in Single Crystals of Cu3Au
- 1 January 1950
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 21 (1) , 24-30
- https://doi.org/10.1063/1.1699415
Abstract
X‐ray diffraction methods have been used to measure long‐ and short‐range order parameters for single crystals of the alloy Cu3Au held at elevated temperatures. It is shown that short‐range order parameters may be obtained by a three‐dimensional Fourier analysis of the ``scattering power'' for the diffuse background scattering of x‐rays, expressed as a function of reciprocal lattice coordinates. Appropriate experimental and computational procedures are outlined. Intensity measurements have been made with a special arrangement of a bent‐crystal monochromator and a Geiger‐counter spectrometer. Short‐range parameters are given for the first ten shells of atoms surrounding a given atom for three temperatures above the critical temperature of Cu3Au. These results, and those for the long‐range order parameter agree well with theoretical predictions.This publication has 8 references indexed in Scilit:
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