An Electron Microscope Investigation of the Structure of Some Amorphous Materials
- 1 June 1972
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 51 (2) , 801-820
- https://doi.org/10.1002/pssb.2220510239
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The Observation of Ordered Domains in Amorphous Ge by Dark‐Field Electron MicroscopyPhysica Status Solidi (b), 1971
- Structural model for amorphous silicon and germaniumJournal of Non-Crystalline Solids, 1971
- Dark Field Images of Amorphous Carbon Films in High Resolution Electron MicroscopyJapanese Journal of Applied Physics, 1971
- Radial distribution studies of amorphous GexTe1−x alloysJournal of Non-Crystalline Solids, 1970
- SHORT-RANGE ORDER IN AMORPHOUS GeTe FILMSApplied Physics Letters, 1970
- Evidence of Voids Within the As-Deposited Structure of Glassy SiliconPhysical Review Letters, 1969
- The structure of vitreous silicaJournal of Applied Crystallography, 1969
- Scanning Electron Diffraction Attachment with Electron Energy FilteringReview of Scientific Instruments, 1969
- THE ATOMIC ARRANGEMENT IN GLASSJournal of the American Chemical Society, 1932