An automated procedure for the correction of background due to inelastic scattering in electron diffraction patterns
- 1 February 1977
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 10 (1) , 64-66
- https://doi.org/10.1107/s0021889877012837
Abstract
The use of electron diffraction in structural studies of fibrous polymers is complicated by the presence of an intense background associated with inelastic scattering. A method of digital processing is described which effectively removes the undesirable features of this background. The method is also applicable in low-angle X-ray diffraction studies.Keywords
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