Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit
- 1 May 1992
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 1631, 219-225
- https://doi.org/10.1117/12.59043
Abstract
A ray-tracing model was used to derive the light scattering Mueller matrix element curves for a dipole near a perfect surface as a function of incident angle, scattering angle, and surface refractive index. This system represents a fundamental system composed of a perfect plane surface and a perfect (Rayleigh) scatterer.Keywords
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