Supply current testing of mixed analogue and digital ICs
- 15 August 1991
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 27 (17) , 1581-1583
- https://doi.org/10.1049/el:19910990
Abstract
A proposed extension of the technique of supply current monitoring to the testing of analogue circuit modules with the intention of developing a unified testing approach for mixed ASICs. Simulation results are reported to illustrate the effectiveness of the method.Keywords
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