The Study on Microstructure by NMR, FTIR, Raman, Conductivity and Optical Bandgap in Hydrogenated Amorphous Silicon Prepared by Novel Fabrication Methods
- 1 January 1992
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- NMR study of μc-Si:HJournal of Non-Crystalline Solids, 1983
- H NMR in μc-Si:HJournal of Non-Crystalline Solids, 1983
- NMR in-SiPhysical Review B, 1982
- Proton-magnetic-resonance studies of microstructure in plasma-deposited amorphous-silicon—hydrogen filmsPhysical Review B, 1981