The projection geometry of the field-ion image
- 1 July 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 75 (1) , 129-140
- https://doi.org/10.1016/0039-6028(78)90057-2
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- On the quantitative analysis of field-ion micrographsMetallography, 1974
- General properties of the field-ion image projectionSurface Science, 1971
- Optical Transformation of Field Ion MicrographsReview of Scientific Instruments, 1970
- A method for indexing field ion micrographsJournal of Scientific Instruments, 1967
- The accurate determination of crystal orientation from field ion micrographsJournal of Scientific Instruments, 1964
- Field Ionization and Field Ion MicroscopyPublished by Elsevier ,1960
- On the Magnification and Resolution of the Field Emission Electron MicroscopeJournal of Applied Physics, 1956