A low energy electron diffraction technique for accurate absolute determination of surface lattice constants
- 1 October 1972
- Vol. 22 (10) , 489-491
- https://doi.org/10.1016/0042-207x(72)90227-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Contaminants on chemically etched silicon surfaces: LEED-Auger methodSurface Science, 1970
- Absolute Präzisionsbestimmungen von Gitterkonstanten an Silicium-Einkristallen mit Elektroneninterferenzen *Zeitschrift für Naturforschung A, 1967
- Design of Square Helmholtz Coil SystemsReview of Scientific Instruments, 1966