Anomalous Surface Reflection of X Rays
- 1 September 1963
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 131 (5) , 2010-2013
- https://doi.org/10.1103/physrev.131.2010
Abstract
An asymmetric surface reflection of x rays was found. It was experimentally determined that this anomalously reflected wave has almost the same wavelength as the incident wave. The angle of this reflection changes only slightly with the incident angle and the crystal structure of the sample in the measured angular range. The glancing angle of this reflection increases with the wavelength of the incident x rays. According to measurements on evaporated surfaces of metallic elements, these reflection angles were found to have an important relation to the periodic system of the elements.Keywords
This publication has 7 references indexed in Scilit:
- Density Measurements of Some Thin Copper FilmsJournal of Applied Physics, 1959
- Untersuchungen über die Totalreflexion weicher RöntgenstrahlenAnnalen der Physik, 1959
- Über eine Vereinfachung der Prismenmethode zur Bestimmung des Brechungsindex für RöntgenlichtThe Science of Nature, 1958
- Apparent Density of Thin Evaporated FilmsJournal of Applied Physics, 1954
- X-Ray Wave-Lengths by The Dispersion in QuartzPhysical Review B, 1932
- Interferenz von Röntgenstrahlen an dünnen SchichtenAnnalen der Physik, 1931
- Interferenz von Röntgenstrahlen an dünnen SchichtenThe Science of Nature, 1930