Electrofracture mechanics of dielectric aging
- 15 July 1984
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 56 (2) , 455-459
- https://doi.org/10.1063/1.333931
Abstract
We introduce a fracture mechanics concept of aging in solid dielectrics. The key element is that growth of a damage structure is only possible if the release of electrostatic energy due to growth exceeds the formation energy of the damage structure. Both the electrostatic energy release and the formation energy are calculated for simple examples.This publication has 4 references indexed in Scilit:
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