Self-Test in a Standard Cell Environment
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 3 (6) , 35-41
- https://doi.org/10.1109/MDT.1986.295051
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Self-Testing the Motorola MC6804P2IEEE Design & Test of Computers, 1984
- A very fast multiplication algorithm for VLSI implementationIntegration, 1983