Viscous Waves in 4He Films

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Abstract
A quartz crystal resonator was used to generate viscous shear waves, penetration depth ∼ 20 nm, in HeI and HeII films. The complex transverse acoustic impedance was measured and interpreted using transmission line theory. Normal films of thickness 1.5<dT λ, measurements were made on saturated films with 14<d<23 nm. An unexpected feature may be due to a standing wave resonance on vortices. The efficiency for the evaporation of atoms from the film surface by rotons was determined.

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